High-Frequency Probes in Semiconductors: The ‘Invisible Guardian’ Behind Huawei’s Pura 80 Series

High-Frequency Probes in Semiconductors: The 'Invisible Guardian' Behind Huawei's Pura 80 Series

On June 11, 2025, Huawei made a stunning debut with the Pura 80 series smartphones, quickly becoming the focus of the tech world. From design to performance, this series showcases Huawei’s innovative strength, with many highlights drawing attention. Behind this series of outstanding performances lies an ‘unsung hero’—the high-frequency probes, which play a crucial role … Read more

Comprehensive Solutions for Post-Silicon Validation and Chip Testing

Comprehensive Solutions for Post-Silicon Validation and Chip Testing

In the complex journey of chip development, Post-Silicon Validation (PSV) plays a crucial role. Once the chip transitions from design blueprints to actual silicon wafers, PSV becomes the core process to verify whether it meets the expected functionality and performance. From a technical perspective, PSV primarily involves inputting various test vectors into the chip to … Read more

Basics of DFT: JTAG

Basics of DFT: JTAG

JTAG: The Core Interface for Chip Testability Design In the field of integrated circuit (IC) design, Design for Testability (DFT) is a key technology to ensure high reliability and yield in chip production. JTAG (Joint Test Action Group), as a standard test access interface, has become an important means for modern chips to implement DFT … Read more

Why Chip Programming Fails

Why Chip Programming Fails

Beijing Zhixin Technology is a long-established chip decryption company that can decrypt a wide range of chip models.After decryption, we can provide chip programming services and programming recommendations.Some customers have reported programming failures during mass production; is this an issue with the chip itself?Or is it a problem with the programmer?What other possibilities might there … Read more

Semiconductor Processes and Equipment: Chip Testing and Devices

Semiconductor Processes and Equipment: Chip Testing and Devices

Source: Semika Original Author: Semika Testing is an important means to ensure functionality and yield.Chip testing can be mainly divided into two parts.CP (chip probing) and FT (final test).Some chips will also undergo SLT (system level test).Additionally, some specific requirement chips need reliability testing. CP Testing CP (Chip Probing) testing, also known as wafer testing, … Read more

What Is JTAG? A Brief Introduction

What Is JTAG? A Brief Introduction

Original: Wolonghui Wolong Village Master Previously, some netizens asked what the JTAG principle is? Today, I will briefly explain it. JTAG is a debugging, testing, and online programming interface. JTAG (Joint Test Action Group) JTAG is an embedded debugging technology used to test chips. Once the circuit board is soldered, how can we ensure that … Read more