DAP, JTAG, and Boundary Scan

DAP, JTAG, and Boundary Scan

DAP and JTAG There are various ways to connect to the Debug Access Port (DAP), which differ in cost, invasiveness, and security. The DAP allows access to the core within the chip, which is typically the first to boot or is a dedicated microprocessor used for managing chip boot, debugging, and initializing DVFS and DRAM … Read more

Analysis of JTAG Principles and Its Application in ATE DFT Testing

Analysis of JTAG Principles and Its Application in ATE DFT Testing

JTAG (Joint Test Action Group) is an international standard testing protocol (IEEE 1149.1) primarily used for testing, debugging, and programming chips, PCBs, and systems. Through a dedicated hardware interface and protocol, it provides non-intrusive access to the internal circuits of chips. The JTAG protocol is widely used in embedded development, hardware verification, and fault diagnosis. … Read more

Comprehensive Solutions for Post-Silicon Validation and Chip Testing

Comprehensive Solutions for Post-Silicon Validation and Chip Testing

In the complex journey of chip development, Post-Silicon Validation (PSV) plays a crucial role. Once the chip transitions from design blueprints to actual silicon wafers, PSV becomes the core process to verify whether it meets the expected functionality and performance. From a technical perspective, PSV primarily involves inputting various test vectors into the chip to … Read more