EJTAG

MCU Testing and External NOR Programming Using JTAG_BSDL – LPC1857 Example

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MCU Testing and External NOR Programming Using JTAG_BSDL - LPC1857 Example

1. Introduction Previously, we sharedhttps://mp.weixin.qq.com/s/BeL6UbSg2HI9qKemZugOhw?token=1054074707&lang=zh_CN the article titled“Low-Cost Learning FPGA Based on“Mining Board”” which usesJTAG boundary scan for quick pin correspondence reverse engineering.. Not only forFPGAs, but we can also useJTAG for boundary scan testing inMCUs, provided that the corresponding chip supports this feature and the manufacturer providesBSDL files. Here, we will demonstrate using theLPC1857 … Read more

Pull-Up and Pull-Down Signals in JTAG

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Pull-Up and Pull-Down Signals in JTAG

1 Description in the JTAG Standard Latest JTAG standard: IEEE_std_1149.1-2001 Figure 1 JTAG Principle 1.1 TMS TMS is the start enable signal (Standard PAGE-11), pull-up: 1.2 TCK TCK is the clock signal (Standard PAGE-9) effective on the rising or falling edge, can be pulled up or pulled down, depending on specific device requirements: 1.3 TDI … Read more

Understanding JTAG and Its Alternatives

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Understanding JTAG and Its Alternatives

This article mainly introduces the terms related to JTAG that are easily confused: JTAG JTAG (Joint Test Action Group): In the early application of chips, different manufacturers had different testing methods for chips, making the joint testing of chips and boards very difficult. A unified testing method was needed to solve this problem. The JTAG … Read more