Case Study Share Optical Detector of SEM for Z-axis Height Measurement Above Semiconductor Wafer No.1 01 Problem to be Solved in This Case 1 A semiconductor OEM (Original Equipment Manufacturer) manufacturer wants to add a new feature to their existing SEM (Scanning Electron Microscope) system to enhance productivity. They need a fast and reliable method … Read more
In the context of further cost reduction and efficiency improvement in the industry, the secondary utilization of edge materials in the silicon wafer stage aims to enhance the first-use rate of pulling silicon rods and reduce the recovery and processing of edge materials as well as the amount sent to the furnace, which is currently … Read more
Chips are hidden in the electronic devices that can be seen everywhere in the city, such as smartphones, computers, and home appliances, all of which rely on its control. Image source: pixabay The tiny chip integrates a large scale of circuits. If we magnify the chip, we can see that there are densely arranged circuits … Read more