This article mainly introduces the pin definitions, interface standards, boundary scan, and TAP controller of the JTAG bus. JTAG (Joint Test Action Group) is an international standard testing protocol (IEEE 1149.1 compatible), primarily used for internal chip testing. Most advanced devices now support the JTAG protocol, such as ARM, DSP, FPGA, etc. The standard JTAG … Read more
Hello everyone, I am Pi Zi Heng, a serious tech enthusiast. Today, I will talk about the interface standard JTAG in embedded debugging. In embedded development, it is inevitable to simulate and debug code, especially when the application logic becomes complex to a certain extent. It is common to introduce some logical bugs while writing … Read more
After familiarizing ourselves with the JTAG architecture through a series of previous articles, let’s take a complete example to understand how the TAP used for Debug access works. Assuming a debugging scenario where we need JTAG to access and modify a 3-bit wide control signal due to debugging requirements. In normal functional mode, the value … Read more
Basic structure of JTAG: Standard Ports: TCK (Test Clock) – This signal synchronizes the operation of the internal state machine. TMS (Test Mode Select) – This signal samples at the rising edge of TCK to determine the next state. TDI (Test Data Input) – This signal represents the data for the device under test or … Read more
Do you understand the meaning of each JTAG pin? JTAG has 10-pin, 14-pin, and 20-pin versions. Although the number of pins and the arrangement order differ, some of the pins are the same. The definitions of each pin are as follows. 1. Pin Definitions Test Clock Input (TCK) —– Required 1 TCK is a mandatory … Read more
Debugging chips relies heavily on the JTAG interface. Downloading and debugging programs must be accomplished through the JTAG interface. Today, I learned some basic principles and working processes of the JTAG interface, and I will summarize them briefly. The JTAG interface is an international standard testing protocol, originally initiated by several electronic device manufacturers who … Read more
Interface Name: JTAG Full English Name: Joint Test Action Group Chinese: 联合测试工作组 Standard Number: IEEE1149.1-1990/IEEE1149.1a-1993 Standard Maintenance: IEEE Current Specification: www.IEEE.org Latest Version: IEEE1149.1-2013 Standard Test Access Port and Boundary-Scan Architecture Effective Date: 2013 Next Version: TBD Description: JTAG is an international standard testing protocol (IEEE 1149.1 compatible), primarily used for internal testing of chips. … Read more
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