Third Generation Sensors | Optical Dewar Link for Focal Plane Detectors

Third Generation Sensors | Optical Dewar Link for Focal Plane Detectors

Infrared focal plane detector Dewar components integrate optical elements. Optical Dewar packaging: Built-in optical components (filters, field lenses, aperture stops, cold shields, etc.) are included. 1. Optical lenses replace planar optical windows (simplifying system design, applicable to focal planes). 2. Cold shield integrated optical lenses (spatial non-uniformity correction?). 3. Variable cold aperture (dual F-numbers F/3, … Read more

Domestic Lasers Have Accumulated Numerous New Technologies Awaiting Application in the 3D Printing Industry: An Exploration of Baochenxin Factory by Polar Bear

Domestic Lasers Have Accumulated Numerous New Technologies Awaiting Application in the 3D Printing Industry: An Exploration of Baochenxin Factory by Polar Bear

Abstract: After interviewing the laser product solution provider Baochenxin, Polar Bear has a vague feeling that in the future, whether for industrial-grade 3D printing with metals or non-metals like nylon, innovations and explorations in laser performance parameters of hardware will become one of the important breakthrough directions in the qualitative change process of 3D printing … Read more

Latest Analysis of the LiDAR Industry Chain: Increased Space for Domestic Substitution of Emitters and Detectors

Latest Analysis of the LiDAR Industry Chain: Increased Space for Domestic Substitution of Emitters and Detectors

Abstract: Domestic manufacturers of complete machines and optics possess global competitiveness, with significant potential for domestic substitution of emitters and detectors.The acceleration of LiDAR industrialization has brought investment opportunities to the domestic supply chain.Domestic companies in the optical system field have global competitiveness in areas such as collimating mirrors, beam splitters, diffusers, and mirrors.The proportion … Read more

Laser Fault Injection Microsystem for IC Chip Testing

Laser Fault Injection Microsystem for IC Chip Testing

Integrated circuits in aerospace applications are affected by the space radiation environment, facing the risk of failure. One of the main faults occurs when a single high-energy particle passes through sensitive nodes in the chip, generating ionized charge, leading to data flips, functional failures, current surges, or even destruction of the chip. The fault injection … Read more