Design for Testability

Overview of Clock Design in SoC

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Overview of Clock Design in SoC

In SoC (System-on-Chip) design, clock design is a core and highly challenging task that directly affects the chip’s performance, power consumption, reliability, and testability. A robust SoC clock architecture needs to consider multiple factors. Core Objectives. Functional Correctness: Ensure all modules operate on the correct clock edge, meeting timing constraints. High Performance: Provide clock frequencies … Read more

Basics of DFT: JTAG

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Basics of DFT: JTAG

JTAG: The Core Interface for Chip Testability Design In the field of integrated circuit (IC) design, Design for Testability (DFT) is a key technology to ensure high reliability and yield in chip production. JTAG (Joint Test Action Group), as a standard test access interface, has become an important means for modern chips to implement DFT … Read more