The Data Dilemma in Semiconductor Testing and Its Importance (Part 1)

The Data Dilemma in Semiconductor Testing and Its Importance (Part 1)

In today’s semiconductor industry, machine learning (ML) is no longer just a buzzword but a necessity for operations. From optimizing testing processes to identifying device drift, and executing VMIN or fine-tuning advanced analytics, ML-based applications are increasingly being used to improve yield, enhance quality, and reduce testing costs. However, there is a problem. To make … Read more

Practical Case of PLC: Key Points for Achieving 300% Improvement in Labor Efficiency in Electronic Factory Testing Lines!

Practical Case of PLC: Key Points for Achieving 300% Improvement in Labor Efficiency in Electronic Factory Testing Lines!

Estimated reading time: 8 minutes | Target audience: PLC engineers, automation engineers > 🤔 Have you encountered these issues: – Low testing efficiency in electronic factories, high labor costs? – Testing data is difficult to trace, quality control faces numerous challenges? – Interconnectivity of equipment is problematic, low production line collaboration? – High investment in … Read more