Research on the Mechanism of Reverse Leakage Failure in High-Temperature Semiconductor Storage
1. Introduction1.1. Background and Application ScenariosSemiconductor memory, as a core component of modern electronic systems, directly determines the performance and lifespan of end products. Traditionally, the operating temperature range for most semiconductor devices has been limited to relatively mild conditions. However, with the rapid development of cutting-edge fields such as automotive electronics, aerospace, industrial control, … Read more