Semiconductor Processes and Equipment: Chip Testing and Devices
Source: Semika Original Author: Semika Testing is an important means to ensure functionality and yield.Chip testing can be mainly divided into two parts.CP (chip probing) and FT (final test).Some chips will also undergo SLT (system level test).Additionally, some specific requirement chips need reliability testing. CP Testing CP (Chip Probing) testing, also known as wafer testing, … Read more