1 Introduction Recently, I have been troubled by various trivial matters, and my mind has been restless. Seeing that members of the “Phyphox Bluetooth Experiment Development Group” WeChat group are releasing new works every day, I was also eager to try. Following the example of Teacher Mei from Beijing, I conducted an experiment to “plot … Read more
Introduction This article will continue to delve into the issue of current backflow, analyzing the root causes of IO port damage and system stability problems in embedded systems. In the previous engineering notes, we learned about current backflow and discussed a series of problems it may cause, including IO port damage, system crashes, failure to … Read more
01 In embedded development, current backflow is an easily overlooked issue that can lead to serious consequences. This chapter will delve into the causes, impacts, and how to identify and prevent this issue in practical engineering. The issue of current backflow rarely occurs during the 5V single-chip microcontroller era, mainly because the IO withstand voltage … Read more