Top 10 Techniques for Instrument Fault Diagnosis

Top 10 Techniques for Instrument Fault Diagnosis

Author: zhangtao2: Testing equipment is an indispensable part of our daily production and life. Once these devices malfunction, how should we inspect and diagnose them? Here are some summarized experiences to share with everyone. 1. Observation Method Utilize visual, olfactory, and tactile senses. Sometimes, damaged components may change color, bubble, or show signs of burning; … Read more

The Significance of Using Portable Instruments for Hydraulic System Measurement and Diagnosis

The Significance of Using Portable Instruments for Hydraulic System Measurement and Diagnosis

Click the end of the article to read the original text and select your favorite portable testing instruments Diagnosing hydraulic system failures on-site is challenging, and due to the specific conditions of the site, it has its own characteristics. Firstly, it requires rapid diagnosis. This means that once a failure occurs in the production site … Read more

Automated Testing Solutions for In-Vehicle Infotainment Systems

Automated Testing Solutions for In-Vehicle Infotainment Systems

With the current development of networking and intelligence, user experience is increasingly valued, making the testing of In-Vehicle Infotainment systems (IVI) a focus for various OEMs and suppliers. IVI testing is complex due to its wide-ranging requirements, diverse testing types, and the time and effort involved, gradually becoming a significant factor affecting automotive intelligence. Moreover, … Read more

Understanding Low Energy Bluetooth (BLE) Testing Techniques

Understanding Low Energy Bluetooth (BLE) Testing Techniques

All you need to know about Low Energy Bluetooth (BLE) in 2020 We live in a space where fantasy and reality reflect each other, technology and culture intertwine, individuals and the collective merge, and privacy and transparency find balance. In a world of the Internet of Things, everything is striving to be excellent enough, and … Read more

Getting Started with MQTT Protocol Testing

Getting Started with MQTT Protocol Testing

Introduction MQTT (Message Queuing Telemetry Transport) is a lightweight communication protocol based on the publish/subscribe model, specifically designed for low bandwidth, unreliable, or high-latency network environments. It was released by IBM in 1999 and is suitable for connecting remote devices, particularly Internet of Things (IoT) devices. MQTT provides real-time, reliable message transmission services by reducing … Read more

Profibus DP Bus Fault Diagnosis Methods (4)

Profibus DP Bus Fault Diagnosis Methods (4)

Testing and Measurement Tools 1. Handheld Devices Handheld devices are specially developed for testing PROFIBUS cables with RS 485 interfaces. For example, Siemens BT200 (recommended) and ComSoft Nettest II. Handheld devices can test the installation, as well as check the PROFIBUS cables and stations. To use the handheld device, it must be connected to the … Read more

Understanding JTAG Boundary Scan Technology

Understanding JTAG Boundary Scan Technology

Follow our public account for timely updates on new articles. Introduction: Engineers engaged in hardware, embedded systems, or chip-related fields are likely familiar with JTAG. JTAG primarily has three main uses: Testing and Diagnosis: Initially, the main purpose of JTAG was for testing and diagnosing integrated circuits, used to detect and repair defects in the … Read more

Introduction to JTAG Testing Protocol

Introduction to JTAG Testing Protocol

Introduction to JTAG JTAG (Joint Test Action Group) is an international standard testing protocol (IEEE 1149.1 compliant), primarily used for internal testing of chips. Most advanced devices today support the JTAG protocol, such as DSPs and FPGAs. The standard JTAG interface consists of 4 lines: TMS, TCK, TDI, and TDO, which correspond to mode selection, … Read more

JTAG Interface Learning Notes

JTAG Interface Learning Notes

Interface Name: JTAG Full English Name: Joint Test Action Group Chinese: 联合测试工作组 Standard Number: IEEE1149.1-1990/IEEE1149.1a-1993 Standard Maintenance: IEEE Current Specification: www.IEEE.org Latest Version: IEEE1149.1-2013 Standard Test Access Port and Boundary-Scan Architecture Effective Date: 2013 Next Version: TBD Description: JTAG is an international standard testing protocol (IEEE 1149.1 compatible), primarily used for internal testing of chips. … Read more