Interpretation of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Technology
Source: Old Thousand and His Friends Original Author: Sun Qian The Time-of-Flight Secondary Ion Mass Spectrometer has developed into a powerful micro-surface analysis application technology. This technology can be applied in areas where traditional dynamic SIMS cannot, with the following advantages: it can synchronously detect different ions over an almost unlimited mass range; it has … Read more