

Abstract:
Hardware transient faults have been shown to significantly impact deep neural networks, especially in safety-critical applications such as autonomous vehicles, healthcare, and aerospace, where the probability of misclassification can increase by up to four times. However, accurately assessing inaccuracies using precise fault injection methods is very time-consuming, potentially requiring several hours or even days on a complete simulation platform. To accelerate the evaluation of hardware transient faults on deep neural networks, a unified end-to-end automated method called A-Mean has been designed. This method utilizes the silent data loss rates of basic operations (such as convolution, addition, multiplication, activation functions, max pooling, etc.) and a static two-level mean calculation mechanism to quickly compute the overall silent data loss rate, estimating the accuracy of general classification metrics and the safety-critical misclassification of specific application metrics. More importantly, a maximum strategy is employed to determine the silent data loss boundaries of non-sequential structures within the deep neural network. The static safety-critical misclassification results are then merged with the original data from a single dynamic fault-free execution, and a worst-case scenario is further calculated to assess the amplified safety-critical misclassification and halved accuracy under transient faults. Additionally, all of the above steps have been automated, allowing this user-friendly automated tool to be used for rapid evaluation of transient faults across various deep neural networks. A new metric, “fault sensitivity,” is defined to characterize the changes in safety-critical misclassification and accuracy reduction caused by transient faults. Comparisons with the state-of-the-art fault injection method TensorFI+ across five deep neural network models and four datasets indicate that the proposed evaluation method A-Mean achieves up to 922.80 times acceleration, with an average safety-critical misclassification loss and accuracy loss of only 4.20% and 0.77%, respectively. Relevant results of A-Mean can be accessed at https://github.com/breatrice321/A-Mean.
Keywords:Analysis Model; Deep Neural Networks; Hardware Transient Faults; Rapid Evaluation; Automated Evaluation ToolsAuthors:
| Jiajia JIAO, Ran WEN, Hong YANG
Affiliation: School of Information Engineering, Shanghai Maritime University, Shanghai, China, 201306 Citation Format: Jiajia JIAO, Ran WEN, Hong YANG, 2025. An end-to-end automatic methodology to accelerate the accuracy evaluation of deep neural networks under hardware transient faults. Frontiers of Information Technology & Electronic Engineering, 26(7):1099-1114. https://doi.org/10.1631/FITEE.2400547 |
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Frontiers of Information Technology & Electronic Engineering (abbreviated as FITEE, Chinese name《信息与电子工程前沿(英文)》,ISSN 2095-9184, CN 33-1389/TP) is a comprehensive English academic monthly journal in the field of information electronics, indexed by SCI-E and EI, with the latest impact factor of 2.9, positioned in the JCR Q2 zone. It was originally established in 2010 as the English version of the Journal of Zhejiang University C: Computer and Electronics, and was renamed in 2015. It is now a sub-journal of the Chinese Academy of Engineering’s journal in the field of information and electronic engineering, covering areas such as computer science, information and communication, control, electronics, and optics. Article types include research papers, reviews, personal viewpoints, and commentaries. The current editor-in-chief is Academician Pan Yunhe and Fei Aiguo. The journal implements an international peer review system, with initial feedback typically provided within 2-3 months. Once accepted, articles are published online quickly.
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