Mechanisms of Chip Failure — Hot Carrier Injection (HCI): Concepts, Mechanisms, Prevention, and Degradation Models
(HCI effect in NMOS) 1. Several Concepts Carriers: “Electrons” and “holes” are referred to as carriers — their core mission is to transport charge and form current; Hot Carriers: Carriers that gain excessive energy under the acceleration of an electric field are called hot carriers; (“hot carriers” are particles that attain a very high kinetic … Read more