Conference Introduction
The Internet of Things (IoT) has seen a significant explosion in recent years, and the concept of IoT has become one of the hottest technology trends today. In fact, the demands for lower power consumption, higher reliability and stability of wireless connections, and lower costs require a reevaluation of design and testing methods. In this presentation, we will explore the key testing technologies involved in the latest IoT developments, including Bluetooth, NB-IoT, power consumption testing, and other popular IoT testing technology directions. We will detail how to ensure testing quality and efficiency while reducing testing costs during R&D and mass production testing.
Speaker
Maris
Technical Marketing Engineer, National Instruments USA
Event Time
2018-05-16 14:00 to 16:00
Participation Process
● Click below “Read the Original” to enter the registration page;
● If you are already a member of the International Industrial Automation Network (www.iianews.com), directly enter your username and password to register. If you are not yet a member, please register first;
● On the day of the conference live broadcast, log in to the conference page at 14:00 and enter your username and password to watch the conference;
● Anyone who participates in the interactive Q&A will have a chance to win a beautiful gift provided by NI.
Company Introduction
For nearly 40 years, NI has been dedicated to providing engineers and scientists with solutions to tackle the toughest challenges. With these solutions, NI customers have delivered hundreds of thousands of products to the market, overcoming countless technical bottlenecks and creating a better life for humanity. If you can open, connect, drive, or start a device, it is likely based on NI technology.
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